- Title
- A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements (Invited review article)
- Creator
- Gan, Yang
- Relation
- Review of Scientific Instruments Vol. 78, Issue 8
- Publisher Link
- http://dx.doi.org/10.1063/1.2754076
- Publisher
- American Institute of Physics
- Resource Type
- journal article
- Date
- 2007
- Description
- Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.
- Subject
- cantilevers; atomic force microscopy; near-field scanning optical microscopy; reviews; micromechanical devices; nanotechnology; nanoparticles
- Identifier
- http://hdl.handle.net/1959.13/33750
- Identifier
- uon:3285
- Identifier
- ISSN:0034-6748
- Language
- eng
- Full Text
- Reviewed
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| Thumbnail | File | Description | Size | Format | |||
|---|---|---|---|---|---|---|---|
| View Details Download | ATTACHMENT01 | Publisher version (open access) | 764 KB | Adobe Acrobat PDF | View Details Download |